Numerical datasets corresponding to process parameters, microstructural measurements, laser fluence variations, surface roughness values, I–V characteristics, and Hall mobility measurements of RB–SiC thin films discussed in the manuscript.
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https://figshare.com/articles/dataset/Numerical_datasets_corresponding_to_process_parameters_microstructural_measurements_laser_fluence_variations_surface_roughness_values_I_V_characteristics_and_Hall_mobility_measurements_of_RB_SiC_thin_films_discussed_in_the_manuscript_/29960928
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Numerical datasets corresponding to process parameters, microstructural measurements, laser fluence variations, surface roughness values, I–V characteristics, and Hall mobility measurements of RB–SiC thin films discussed in the manuscript.
创建时间：
2025-08-21
