Magnetically modified double slit-based X-ray interferometry

We performed x-ray based double slit diffraction with one of the slits covered with magnetic material. We then performed the experiment and collected double slit diffraction pattern as a function of external applied field. The dataset included here shows how the fringe moves as a function of applied field and how we can extract optical constant and ultimately relate to magnetization. 
, , # Data from: Magnetically modified double slit-based X-ray interferometry

Dataset DOI: [10.5061/dryad.4tmpg4frb](https://doi.org/10.5061/dryad.4tmpg4frb)

## Description of the data and file structure

Data was collected for X-ray-based double slit diffraction. The idea was to experimentally determine the fringe shift happening due to a change in the refractive index of a magnetic material under a magnetic field. 

### Files and variables

#### Summary of Figure Data

This dataset contains:

1. Fig 1b data: The data is a 1D linecut of the intensity interference-diffraction pattern. The normalized CCD data and normalized fit values are included and plotted against detector distance.
2. Fig 2 data: The data obtained from the registration algorithm to yield the fringe shifts for LCP and RCP light. The other data columns include derived values such as RCP - LCP. These values are scaled to show the fringe shift in terms of electron scattering factors.
3. Fig 3 data: Here, the data in the ma..., ,