Quantum Chip Characterization
收藏DataCite Commons2023-09-11 更新2025-04-15 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1315822091
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资源简介：
We will employ the new set of Al lenses to focus the beam down to submicron dimensions. This focused beam will be utilized to characterize various electronic microchips designed for quantum applications, using an innovative technique known as X-ray Reflectivity tomography, which is currently under development.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2023-09-11
