Probing the SEI on Si anodes using XRR
收藏ESRF Portal2025-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-941275414
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资源简介：
Operando XRR is used to probe in real time the formation of the SEI on model Si surfaces, thus providing valuable insights on the formation and evolution over the first few cycles of this interfacial layer.
创建时间：
2025-01-01
