Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]

Name: Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
Published: 2025-05-06T00:00:00+08:00

DIGITAL.CSIC2025-05-06 更新2026-05-11 收录

原子力显微成像

有机薄膜表征

数据链接：

https://digital.csic.es/handle/10261/388498 数据链接链接失效反馈

官方服务：

资源简介：

Atomic force microscopy data, AFM data.- AFM images can be visualized with Gwyddion (free software)

创建时间：

2025-05-06

Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]

资源简介：

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