In situ monitoring of Sn microstructure during compression by Laue microdiffraction
收藏ESRF Portal2026-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1098376467
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资源简介：
Sn whiskers grown on polycrystalline Sn will be monitored by Laue microdiffraction. Pre compressed and in situ compressed Sn microstructures will be measured every 8 hours. e expect to determine the evolution of strain level around whisker as a function of time and distance from whiskers root.
提供机构：
Jean-Sebastien MICHA
创建时间：
2026-01-01
