In situ monitoring of Sn microstructure during compression by Laue microdiffraction
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资源简介：
Sn whiskers grown on polycrystalline Sn will be monitored by Laue microdiffraction. Pre compressed and in situ compressed Sn microstructures will be measured every 8 hours. e expect to determine the evolution of strain level around whisker as a function of time and distance from whiskers root.
提供机构：
Jean-Sebastien MICHA创建时间：
2026-01-01
