Vibrational EELS Linescans
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Scanning Transmission Electron Microscopy (STEM) Vibrational Electron Energy Loss Spectroscopy (EELS) line scans across silicon atomic columns. The scan direction followed the [110] crystallographic direction of the material. A linescan across a silicon/silicon dioxide interface is also included. Simultaneously acquired high angle annular dark field (HAADF) signals are also included for each EELS line scan.<br><br>Details of the acquisition of the data can be found in the related article in Nature Physics by Venkatraman, Levin, March, Rez & Crozier. A link to article is given below. <br>
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Kartik Venkatraman创建时间：
2019-08-30
