Structure and dynamics of ferroelastic domains in GeTe/Si(111) thin films by scanning X-ray diffraction microscopy

We aim at studying the internal structure of ferroelastic domains in GeTe thin films and their dynamics under thermal annealing. In order to correlate the local structural properties with the ferroelastic domains dynamics we plan to carry out in situ X-ray diffraction experiments using a 70x70 nm^2 sized X-ray beam. By mapping the sample surface using the scanning X-ray diffraction microscopy (SXDM) technique as a function of temperature the evolution of domains shape/size will be correlated with their internal structure (strain field, rotation) with high spatial resolution. These experiments will eventually leads to a better understanding of the microscopic processes that influence the dynamics of the domain walls.