Quantitative investigation of well contact impact on single event transient in sub-20 nm FinFET process
收藏DataCite Commons2025-11-19 更新2026-05-05 收录
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The dataset of paper "Quantitative investigation of well contact impact on single event transient in sub-20 nm FinFET process"
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Science Data Bank
创建时间：
2025-11-19
