Interaction of muonium centres and excess carriers in highly injected silicon

We have developed a method to measure carrier recombination lifetime in crystalline silicon with the photo-muSR technique. The key of the method is to measure the dependence of...我们开发了一种利用光μ子自旋共振（photo-muSR）技术测量晶体硅中载流子复合寿命的方法。该方法的核心在于测量……的依赖关系。