Surface-topography challenge (Sample A72)
收藏DataCite Commons2025-02-10 更新2025-04-09 收录
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资源简介：
Atomic force microscopy (AFM) topography images of a chromium nitride (CrN) sample deposited on a prime-grade polished silicon wafer. Six measurements are included with scan sizes of respectively 0.512, 1.024, 2.048, 5.12, 10.24 and 25.6 μm. All measurements have 512 lines × 512 pixels and the scan rates are 3 lines/s for the scan size of 0.512 μm, 2 lines/s for the scan sizes of 1.024 and 2.048 μm, and 1 lines/s for other scan sizes. The measurements were performed in Tapping mode (amplitude modulation) on a Multimode IIIA AFM by using a ContAl-G probe (BudgetSensors, Bulgaria), which has a nominal tip apex radius of approx. 10 nm.
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contact.engineering
创建时间：
2025-02-10
