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The anisotropy in the optical constants of quartz crystals for soft X-rays

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NIAID Data Ecosystem2026-03-12 收录
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https://zenodo.org/record/4118055
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资源简介:
The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. In the datasets the 1-delta and beta values for the (100) and (001) direction of the SiO2 crystal for the different energies are provided.
创建时间:
2020-10-23
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