Testing of Latching Current Limiters for Single Event Effects
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As part of the activities relating to the TRISAT project, we have developed an approach to designing SEE tolerant electronic circuits by using COTS components. The approach...
作为TRISAT项目相关研究活动的一部分，我们提出了一种基于商用现货（Commercial Off-The-Shelf，COTS）组件设计抗单粒子效应（Single Event Effect，SEE）电子电路的方法。该方法……
