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SPTNO ceramics measured by XPS method

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SPTNO (Sr-Pr-Ti-Ni-O) ceramic were manufactured by solid state reaction, from oxides compounds. Synthesis conducted in air atmosphere at temperature in a range of 800-900 deg. Chemical composition of prepared materials were measured by XPS (X-Ray photoemision spectroscopy) method. UHV OmicronNanotechnology system with 128 channel Argus hemispherical detector was used for measurements. The high resolution skans for each elements were recorded.

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