Measuring the full strain-field tensor around a dislocation
收藏ESRF Portal2028-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2229719867
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资源简介：
Dark-field X-ray microscopy (DFXM) enables three-dimensional, non-destructive mapping of lattice distortions with sub-micrometer resolution inside bulk crystalline materials. Here we propose the use of DFXM to measure the full strain-field tensor around an isolated dislocation. By combining angular- and spatial-resolved diffraction contrast imaging with multi-reflection analysis.
提供机构：
Technical University of Denmark, Department of Physics, DTU Physics Building 307, 2800, Lyngby, DK; Danish Technical University, Materials and Surface Engineering , Produktionstorvet, 425, 107, 2800 Kgs. Lyngby, 2800, Copenhagen, DK; ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France; ESRF, 71 avenue des Martyrs CS 40220, 38043, Grenoble, FR
创建时间：
2028-01-01
