Defect filter construction [Dataset]
收藏DIGITAL.CSIC2019-01-01 更新2026-05-11 收录
下载链接：
https://digital.csic.es/handle/10261/174650
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资源简介：
This data provides the THD measurement of an analog integrated circuit (a buffer) together with some indirect test signatures. Three cases are considered: a MonteCarlo simulation of mismatch variations, a MonteCarlo simulation of process variations and a defect simulation
创建时间：
2019-01-01
