Data and analysis materials for Posterior Inference of Hamiltonian Parameters from RIXS Spectroscopy

Data and analysis materials accompanying the manuscript "Posterior Inference of Hamiltonian Parameters from RIXS Spectroscopy." The study applies simulation-based inference to resonant inelastic X-ray scattering (RIXS), using truncated marginal neural ratio estimation and conditional flow matching to infer joint posterior distributions for Hamiltonian parameters of the Ni(2+) compounds NiPS3 and K2NiF4. The accompanying materials support inspection and reproduction of the experimental-data analysis and posterior results.