Data Bundle for: Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns
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This package contains electron backscatter diffraction patterns which supports the paper: "Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns"by Ben Britton* and Tianbi Zhang Department of Materials Engineering, University of British Columbia, Vancouver, British Columbia, Canada Email address: ben.britton@ubc.ca--Data was collected on an Thermo Fisher APREO ChemiSEM, with the TruePix Direct Electron Detector. As per the methods section of the paper: "EBSD was performed in a Thermo Fisher Scientific Apreo 2 ChemiSEM with a TruePix EBSD detector at 20 keV landing energy. The TruePix detector is based on the Timepix chip with a Si sensor, which has 256x256 pixels with a pixel pitch of 55 µm. The detector operated in electron counting mode with an energy threshold of 19.4 keV (97% of the primary electron beam energy). EBSD patterns were captured from a single crystal of semiconductor grade silicon mounted on an Al-stub, with the [001] direction out of plane and two corresponding {110} fracture surfaces aligned close to the vertical and horizontal beam scanning directions. The sample was mounted on the 45° pre-tilt holder of the multi purpose holder, and the stage was tilted a further 25° to tilt the sample at 70° in total. " The data can be analysed in xTalView, or via AstroEBSD: https://github.com/ExpMicroMech/AstroEBSD/blob/main/decks/SinglePatchEBSP_Plus_SNR.m The folder contains the following experiments: Increasing exposure time: \TFS_SuperRes\ExpTime The map used to create the super resolution patterns: \TFS_SuperRes\Res_Map\2025-08-14T11_28_18 Data collected at a high spatial magnification: \TFS_SuperRes\Res_Map\2025-08-14T13_02_16 Data collected with the detector retracted: \TFS_SuperRes\Res_Map\2025-08-14T11_46_24 We acknowledge the following funding support: Natural Sciences and Engineering Research Council of Canada (NSERC) [Discovery grant: RGPIN-2022-04762, ‘Advances in Data Driven Quantitative Materials Characterization’], Canada Foundation for Innovation and British Columbia Knowledge Fund (BCKDF) via the John R. Evans Leaders Fund (CFI-JELF) [#43737, 3D-MARVIN].



