Data for Correlation Symmetry Analysis of Electron Nanodiffraction from Amorphous Materials
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资源简介：
Data for "Correlation Symmetry Analysis of Electron Nanodiffraction from Amorphous Materials" by Shuoyuan Huang, Carter Francis, Jittisa Ketkaew, Jan Schroers, Paul M. Voyles.
Data consist of experimental electron nanodiffraction patterns from metallic glasses. Experimental data were collected on Pd<sub>40</sub>Ni<sub>10</sub>Cu<sub>27</sub>P<sub>20</sub> metallic glass nanowires with a 2 nm diameter, 200 kV electron probe beam on a Titan STEM using a Gatan US1000 CCD camera. The nanowires were 41 ± 3 nm thick. Jupyter notebooks demonstrate analysis of this data for its rotation symmetries using the angular power spectrum and the correlation symmetry coefficients.
提供机构：
Materials Data Facility
创建时间：
2021-06-01
