Sb2S3_line1_EBSD_fastscan
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Electron backscattered patterns for each point of an laser-fabricated Sb2S3 crystal in glass. Collected with TSLOIMElectron backscattered patterns for each point of a laser-fabricated Sb2S3 crystal in glass. Collected with TSL OIM Data Collection software on a Hitachi 4300 SE. Microscope was operated in variable pressure mode with 30 Pa using an accelerating voltage of 30 kV and a working distance of about 17 mm. Crystal was tilted 70° relative to the beam. X-, Y-coordinates are in 10 nm units.
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Zenodo创建时间：
2019-10-03
