Dielectric material, KTN, under electric field measured by diffuse x-ray scattering

We propose to study dielectric materials with an in-situ methodology that will use an applied voltage measuring diffuse scattering. In particular, our idea is to study an important material for technologic purpose as potassium tantalite niobite, a perovskite ferroelectrics KTaxNb1-xO3 (KTN), and measure the difference in the diffuse scattering with and without an electric field.