Microstructure and electrical properties of co-sputtered Cu embedded amorphous SiC
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http://eprints.soton.ac.uk/388275/
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资源简介：
Dataset of figures in the paper "Microstructure and electrical properties of co-sputtered Cu embedded amorphous SiC". These dataset including EDS, XRD, SEM, low-temperature resistance, resistivity measurements on a-SiC:Cu films and capcitance and current density-voltage measurements on Cu/a-SiC:Cu/Au microcapacitors.
提供机构：
University of Southampton
创建时间：
2016-04-25
