Texture data of Additively Manufactured Ti-6Al-4V (Different Scanning Strategies)
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资源简介：
Electron Backscatter Diffraction data collected from 3 electron-beam Ti-6-Al-4V AM samples, using 3 different additive manufacturing techniques: raster (L), Dehoff (D) and random (R), at three different heights (bottom, middle and top) of the builds.<br>
创建时间：
2021-04-16
