Neutron scattering study on altermagnetic Mn5Si3 thin films

This proposal aims to investigate the magnetic structure of epitaxial Mn5Si3 thin films using neutron diffraction. Building on previous experiments, we have prepared higher quality thin films that maintain the hexagonal crystal structure under epitaxial strain, allowing for the stabilization of a presumed collinear magnetic phase up to 240 K. The proposed study will provide crucial insights into the checkerboard magnetic order expected in these films, which is suggested as an explanation for various observed anomalous transport effects in this material. Given the limitations of alternative techniques, neutron diffraction is the only viable method to directly confirm this magnetic structure. The results are anticipated to advance the understanding of altermagnetic materials and have potential applications in spintronics, including the realization of giant magnetoresistance in a material with compensated magnetic order. A total of five days of beamtime is requested to measure multiple reflections at different temperatures and orientations.