Crystal orientation measurements obtained via Electron Backscatter Diffraction (EBSD) on a nickel surface

Electron Backscatter Diffraction (EBSD) is a technique used to examine the crystalline structure of materials by measuring crystal orientations, which are represented as three-dimensional rotations, over a scanned surface. In this study, EBSD data were collected from the surface of a nickel specimen on a regular grid with spacing of 1 micro m X 1 micro m.Data 1: It consists of 14 orientation measurements obtained from independently repeated EBSD scans at a single location on the specimen. Each measurement is represented as a 3×33 \times 33×3 orientation matrix, provided in vectorized form. Data 2: The rotations are measured at different sites scanned on nickel surface, belonging to a grid of dimension $24 \times 3$.