Data used in:Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001)
收藏DataCite Commons2025-03-31 更新2025-04-16 收录
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https://data.fz-juelich.de/citation?persistentId=doi:10.26165/JUELICH-DATA/F1JRQW
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资源简介：
It contains the obtained raw data by low energy electron microscopy (LEEM), and Angle-resolved Photoemission Spectroscopy (ARPES). The data are stored in the type of TIF (.tiff), and each TIF file is an image-sequence of LEEM.
提供机构：
Jülich DATA
创建时间：
2025-03-31
