Supplementary data from the NIST lattice comparator associated with paper "The NIST Silicon Lattice Comparator Upgrade"
收藏NIST Chemistry WebBook2023-03-10 更新2026-03-14 收录
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https://data.nist.gov/od/id/mds2-2913
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The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.
