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Mutual inductance between capacitors and insertion loss under different layouts

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IEEE2026-04-17 收录
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https://ieee-dataport.org/documents/mutual-inductance-between-capacitors-and-insertion-loss-under-different-layouts
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In an electromagnetic interference (EMI) filter, the mutual inductance between the parasitic inductances of the capacitors on both sides of the common-mode choke (CMC) is crucial to the high-frequency performance of the filter. It degrades the filter's performance by directly coupling part of the noise voltage from the noise source side to the LISN side. This dataset tests the mutual inductance and the insertion loss of the filter when the two capacitors are placed in parallel (traditional layout), vertically, and under both positive and negative coupling conditions. This demonstrates the performance of the EMI filter under different mutual inductance scenarios.
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