Modulated interferometer (data)

Our work involves a novel method for detecting phase shifts in two-photon Raman excitations. Our beams originate from an electro-optical modulator and, upon passing through a sample, undergo a phase shift that is observed in their beating on a fast detector. The signal is compared to a reference in a microwave interferometer. This modulated interferometer exhibits 18,600 times greater temperature immunity than the robust displaced Sagnac interferometer. This setup maintains its sensitivity to relative phase shifts between beam pairs, as is the case with Electromagnetically Induced Transparency.