Dataset of "Spectrally resolved work function and photovoltage of nanocrystalline diamond films with SiV centers"

In this work, we use spectrally resolved illumination by a tunable laser to study the SiV-enriched NCD layers with different thicknesses and two surface modifications to better understand if and in which PL SiV spectral regions in the SiV NCD layer exhibits a specific SPV response. The time-resolved work function (WF) and surface photovoltage (SPV) were characterized by Scanning Kelvin Probe, cycling the dark condition and illumination by a quasi-continuum tunable laser at different wavelengths in the range 400-800 nm, band width 10 nm, and increment 20 nm. The SPV response varies depending on the illumination wavelength, diamond surface termination and SiV layer thickness. The most pronounced SPV response was determined in the red spectral region, specifically in the range of 620-640 nm for H-term and 600-620 nm for O-term samples. It indicates specific contribution of SiV to SPV in the thin films. The NCD film thickness also influences the SPV response.