Author-created evidence package for Evaluation Protocols, Policy Choices and Conditional Value in Semiconductor Discarding and Injection-Moulding Inspection

Code, derived results and the files referenced in the supplementary material for the manuscript "Evaluation Protocols, Policy Choices and Conditional Value in Semiconductor Discarding and Injection-Moulding Inspection" by Yong Hee Han. Third-party raw datasets and source-paper full texts are not redistributed; they remain available from their original providers. Code is MIT-licensed; author-created documents and results are CC BY 4.0. See README.md and LICENSE inside the archive.