STEM imaging of Yb14MgSb11 and Yb14MnSb11 samples for grain size analysis

Content: STEM imaging for grain size analysis and EDS results for Yb14MgSb11 and Yb14MnSb11 thermoelectric samples obtained via hot pressing at different temperatures. Folders are labelled as composition and hot pressing temperature (e.g. 'Yb14MgSb11_1300C' for Yb14MgSb11 hot pressed at 1300 °C. The Excel file GrainSize.xslx contains the data analysis using the mean intercept method. Collection and analysis method: Bright field Scanning transmission electron microscopy (STEM) and Energy Dispersive X-ray Spectroscopy (EDS) were conducted on a Jeol 2100 microscope operated at 200 kV using a camera length of 40 cm. Lamellae for STEM and EDX were prepared using Ga+ focused ion beam (FIB) in a Scios2 dual beam microscope. Source article: Funding: Project “MetaSCT: Metamaterials for Thermoelectric Applications - multiscale Structure, Chemistry, Thermal Property relations to uncover the local behavior of grain boundaries” under HORIZON Europe: Marie Skłodowska-Curie Actions Postdoctoral Fellowships (project number 101150912).