Gan Stripes Ebsd
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资源简介：
Raw EBSD Data for a GaN thin film sample with changing polarities and crystal structures as published in: Point-Group Sensitive Orientation Mapping Using EBSD. Winkelmann A., Nolze G., Himmerlich M., Lebedev V., Reichmann A. (2016) In: Holm E.A. et al. (eds) Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&GG 2016). Springer. The data was measured by G.Nolze, the sample was provided by V. Lebedev and M. Himmerlich<br> https://doi.org/10.1007/978-3-319-48770-0_41 The data in static_bam_ef.txt is a static EBSD background image (taken from a different experiment with the same detector)
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Zenodo创建时间：
2018-08-15
