Figure 3: Assembly formation and characterization with Helium Ion Microscopy (HIM), Atomic Force Microscopy (AFM), and Transmission Electron Microscopy (TEM)

Figure 3: Assembly
formation and characterization with Helium Ion Microscopy (HIM), Atomic Force
Microscopy (AFM), and Transmission Electron Microscopy (TEM), all reveal fractal-like topologies
on a surface, (A to G) Longer
fractal-like structures, branch-like, and flower-like structures are seen in
HIM (A to C) and AFM (D). (E) Representative HIM images for
assemblies obtained at different concentrations of pY-AtzAM1 (250 nM- 3 µM)
while maintaining a fixed concentration of AtzCM1-SH2 (2 µM). Increasing
concentrations of pY-AtzM1 result in larger assemblies with higher fractal
dimensions. (F) Df and l,
the fractal dimension and lacunarity of the images, are similar for images
obtained from different microscopy techniques. HIM images show fractal-like
assembly formation with pY-AtzAM1 and AtzCM1-SH2 (G), while the Gly-Ser-rich linker-containing variants form globular
assemblies under these conditions (H).