New approach to controllable nitrogen doping for improved nano-semiconductors
收藏Figshare2024-05-17 更新2026-04-28 收录
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https://figshare.com/articles/dataset/New_approach_to_controllable_nitrogen_doping_for_improved_nano-semiconductors/25807825
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资源简介：
The data covers the following:X-ray photoelectron spectroscopy (XPS) - to collect surface chemical structure changes (using RMIT instrument);Scanning electron microscopy (SEM) - to collect surface physical structure changes;Atomic force microscopy (AFM) - to collect surface morphology changes;Internal/External quantum efficiency (IQE/EQE) – to collect DSSC (Dye Sensitised Solar Cells) efficiency data;Discharge/Charge capacity - to collect battery efficiency data.
创建时间：
2024-05-17
