New approach to controllable nitrogen doping for improved nano-semiconductors

The data covers the following:X-ray photoelectron spectroscopy (XPS) - to collect surface chemical structure changes (using RMIT instrument);Scanning electron microscopy (SEM) - to collect surface physical structure changes;Atomic force microscopy (AFM) - to collect surface morphology changes;Internal/External quantum efficiency (IQE/EQE) – to collect DSSC (Dye Sensitised Solar Cells) efficiency data;Discharge/Charge capacity - to collect battery efficiency data.