<strong>Dataset: A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing</strong>

This data repository contains the following information related to the Article: "<strong>A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing"</strong> <br> File 1: RMSE and MSE calculation for SENSOR1 File 2: RMSE and MSE calculation for SENSOR2 File 3: RMSE and MSE calculation for SENSOR2 using HAL/DEUT light source File 4: Interference Interval Method Calculation and Reflectance Curve Modelling <br>