We have developed a method to analyze all rare earth elements in silicate glasses and zircon minerals using a high lateral resolution secondary ion mass spectrometer (NanoSIMS). A 2nA O− primary beam
This dataset is about: (Table T1) Tephra layer description of ODP Hole 186-1150A. Please consult parent dataset @ https://doi.org/10.1594/PANGAEA.783515 for more information.
Supplementary Tables S1-S3 for "Cobalt-rich porphyry deposits derived from multiple mafic magma injections". Supplementary Table S1 presents Major elements data (EPMA, wt%) and trace elements data (LA
Includes SHRIMP-RG data for samples U1309D-588, 3646-1000, 3652-1333, JR31 12-68, and JR31 22-1 that was previously published in Grimes et al. (2007), datasets: doi:10.1594/PANGAEA.721830.