ENVIRONMENTAL X-RAY COMPUTED TOMOGRAPHY (E-CT): 3D CT AT ELEVATED TO CYROGENIC TEMPERATURES
收藏DataCite Commons2024-05-07 更新2025-04-16 收录
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http://dataverse.jpl.nasa.gov/citation?persistentId=doi:10.48577/jpl.JONUBA
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资源简介：
While 2.5D and 3D solutions continue to drive advancements in the electronics packaging industry, challenges persist with their reliability and qualification [1-3]. In this paper, we introduce a new technique that may prove valuable for nondestructive, in-situ measurements of package and die warpage.This system allows for the powerful visualization tools of Computed Tomography to be applied to samples at elevated and cryogenic temperatures over a broad temperature range (+125C to -257C).
提供机构：
Root
创建时间：
2022-10-30
