Practicals for Nanotechnology and Nanosciences Master

The modulated structures of the electronic density in GeTe ferroelectric thin films will be measured by GISAXS and SXRD.碲化锗（GeTe）铁电薄膜中的电子密度调制结构，将通过掠入射小角X射线散射（GISAXS）与X射线衍射（SXRD）进行测量。