Statistics for data collection and refinement.

Values in parenthesis are for the highest resolution shell.aRsym = Σhkl Σi | Ii(hkl)- 〈I(hkl)〉| / Σhkl ΣiIi(hkl), where Ii(hkl) is the intensity of an individual measurement of the symmetry related reflection and 〈I(hkl)〉 is the mean intensity of the symmetry related reflections.bI/σ is defined as the ratio of averaged value of the intensity to its standard deviation.cRcryst = Σhkl ||Fobs|—|Fcalc||/ Σhkl |Fobs|, where Fobs and Fcalc are the observed and calculated structure-factor amplitudes.dRfree was calculated as Rcryst using randomly selected 5% of the unique reflections that were omitted from the structure refinement.eRamachandran statistics indicate the percentage of residues in the most favored, additionally allowed and outlier regions of the Ramachandran diagram as defined by MOLPROBITY.Statistics for data collection and refinement.