X-ray crystallographic data collection and structure refinement statistics.
收藏NIAID Data Ecosystem2026-03-07 收录
数据链接：
官方服务：
资源简介：
†Rsym = ΣΣj|Ij -<I>|ΣIj, where Ij is the intensity measurement for reflection j and <I> is the mean intensity for multiply recorded reflections. ‡R = Σ||Fobs| - |Fcalc||/Σ|Fobs|, where the working and free R factors are calculated by using the working and free reflection sets, respectively. The free R reflections (5% of the total) were held aside throughout refinement.
创建时间：
2013-02-18
