Vibrational EELS Linescans
收藏DataCite Commons2020-08-26 更新2024-08-17 收录
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https://figshare.com/articles/Vibrational_EELS_Linescans/9642950
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资源简介：
Scanning Transmission Electron Microscopy (STEM) Vibrational Electron Energy Loss Spectroscopy (EELS) line scans across silicon atomic columns. The scan direction followed the [110] crystallographic direction of the material. A linescan across a silicon/silicon dioxide interface is also included. Simultaneously acquired high angle annular dark field (HAADF) signals are also included for each EELS line scan.<br><br>Details of the acquisition of the data can be found in the related article in Nature Physics by Venkatraman, Levin, March, Rez & Crozier. A link to article is given below. <br>
提供机构：
figshare
创建时间：
2019-08-30
