Nanocomposite 1:2 demultiplexer based on surface-grafted poly(methacrycic acid) brushes with in situ-fabricated CdS particles

This repository contains raw source data that has been collected and published in the form of an article. AFM topography images (for PMAA, PMAA-Cd and PMAA-CdS systems) were collected using atomic force microscope (AFM) (Dimension Icon XR microscopeBruker, Santa Barbara, CA, USA). All images are unmodified and contain topogaphy channel each. All charts included in Figure 4.A., B. and Figure 5.A. are presented in the form of tables located in separate files. Moreover, all data needed to repeat the information from table 1 (CPD, WF, EF) are included collectively in a separate file.