Data publication: In-situ GISAXS observation of ion-induced nanoscale pattern...
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资源简介：
experimental raw data: in-situ Grazing Incidence Small Angle X-ray Scattering (GISAXS), ex-situ Atomic Force Microscopy (AFM); simulated raw data: surface topography (RIDO)
实验原始数据：原位掠入射小角度X射线散射（Grazing Incidence Small Angle X-ray Scattering，GISAXS）、离线原子力显微镜（Atomic Force Microscopy，AFM）；模拟原始数据：表面形貌（RIDO）
