Data part of a bench-marking experiment. Data collected at Advanced Light Source, beamline 12.2.1 sample: 'challenging' sum formula: C13 H6 F5 N Wavelength: 0.7288 Angstrom Temperature: 100K
The folder contains 121 X-ray diffraction (XRD) images collected from the silver–nitrogen contact region at a pressure of 54 GPa after laser heating to approximately 2700 K. These images can be used t
The authors calculated a complete lattice parameters characterization by Rietveld refinement using Fullprof suite software. Input information, such as cell parameters, atomic positions, and space grou
