Supplemental Material
收藏DataCite Commons2024-07-08 更新2024-07-13 收录
下载链接：
https://aip.figshare.com/articles/dataset/Supplemental_Material/26042035/1
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资源简介：
See Supplemental Material for more details of the atomic force microscopy (AFM) image and height profiles of devices, exchange bias measurement under another method and raw data.
提供机构：
AIP Publishing
创建时间：
2024-07-08
