"Data"
收藏DataCite Commons2026-01-05 更新2026-05-03 收录
下载链接：
https://ieee-dataport.org/documents/embeddeddigitaltwinwithadaptivelearning
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资源简介：
"The file contains reliability test results for a GaN device, a SiC device, and an IGBT, as well as data related to a DC\u2013DC buck converter simulated in MATLAB."
提供机构：
IEEE DataPort
创建时间：
2026-01-05
