Characterization of WSe2 films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses
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This is the data bundle (diffraction and AFM) for the manuscript "Characterization of WSe2 films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses" by T. Zhang, Jakub Holzer, Tomáš Vystavěl, Miroslav Kolíbal, Estacio Paiva de Araujo, Chris Stephens, T. Ben Britton. Please see readme.md for details.
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Zenodo创建时间：
2025-10-16
